|Institution:||University of Saskatchewan|
|Keywords:||beam position monitor; x-ray diffraction; k-edge absorption; phase space|
|Full text PDF:||http://hdl.handle.net/10388/ETD-2015-11-2308|
The stability of the photon beam position on synchrotron beamlines is critical for most if not all synchrotron radiation experiments. On wiggler and bend magnet beamlines, the vertical position is most critical due to the large horizontal width of the beam. The position of the beam at the experiment or optical element location is set by the position and trajectory of the electron beam source as it traverses the magnetic field of the bend magnet or the insertion device. Thus an ideal photon beam monitor would be able to simultaneously measure the photon beam’s vertical position and angle, or its position in phase space. X-ray diffraction is commonly used to prepare a monochromatic beam on x-ray beamlines usually in the form of a double crystal monochromator using perfect crystals. Diffraction from crystals couples the photon wavelength or energy to the incident angle on the crystal or lattice planes within the crystal. A monochromatic beam from such a monochromator will contain a spread of energies due to the vertical divergence of the photon beam from the source. This range of energies can easily cover the absorption edge of an element such as iodine at 33.17keV. It has been found that a system composed of a double crystal monochromator and an iodine filter that horizontally covers part of the monochromatic beam and an imaging detector can be used to independently and simultaneously measure the position and angle of the photon beam. This information can then be translated back to determine the vertical position and angle, or vertical phase space, of the electron beam source. This approach to measurement of the phase space of the source has not been done before and thus this study is the first of its kind. The goal of this thesis is to investigate the use of this combined monochromator, filter and detector as a phase space beam position monitor. The system was tested for sensitivity to position and angle under a number of synchrotron operating conditions (normal operations and special operating modes where the beam is intentionally altered in position and angle). These results were compared to other methods of beam position measurement from the literature to assess the utility of such a system as a beam diagnostic, a feedback element for electron beam control and a source of information that could be used to correct the experimental data to account for beam position and angle motion. Advisors/Committee Members: Chapman, Dean (advisor), de Jong, Mark (committeeMember), Cooper, David (committeeMember).