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by Michael Meyer
Institution: | University of Aizu / |
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Department: | |
Degree: | |
Year: | 2017 |
Keywords: | Fault-tolerant; Photonic; Network-on-Chip; Microring; Reliability |
Posted: | 2/1/2018 12:00:00 AM |
Record ID: | 2158709 |
Full text PDF: | http://id.nii.ac.jp/1257/00000132/;http://dx.doi.org/10.15016/00000132 |
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